i965: Remove blorp unit tests.

They've served their purpose (in transitioning blorp to using
fs_generator) and now they just necessitate large amounts of manual
labor to regenerate if the disassembler changes.

Reviewed-by: Topi Pohjolainen <topi.pohjolainen@intel.com>
Acked-by: Kenneth Graunke <kenneth@whitecape.org>

src/mesa/drivers/dri/i965/.gitignore

@@ -2,4 +2,3 @@ i965_symbols_test
 test_eu_compact
 test_vec4_copy_propagation
 test_vec4_register_coalesce
-test_blorp_blit_eu_gen

src/mesa/drivers/dri/i965/Makefile.am

@@ -56,8 +56,7 @@ TEST_LIBS = \
 TESTS = \
         test_eu_compact \
         test_vec4_copy_propagation \
-        test_vec4_register_coalesce \
-        test_blorp_blit_eu_gen
+        test_vec4_register_coalesce
 
 check_PROGRAMS = $(TESTS)
 
@@ -77,7 +76,3 @@ test_eu_compact_SOURCES = \
 	test_eu_compact.c
 nodist_EXTRA_test_eu_compact_SOURCES = dummy.cpp
 test_eu_compact_LDADD = $(TEST_LIBS)
-
-test_blorp_blit_eu_gen_SOURCES = \
-        test_blorp_blit_eu_gen.cpp
-test_blorp_blit_eu_gen_LDADD = $(TEST_LIBS)